Home Facilities Electron Microscopy FEI Tecnai TEM

postheadericon FEI Tecnai TEM

  • Operating voltage : 200KV
  • Electron Gun : LaB6
  • BF/DF imaging
  • CCD 1k X 1k
  • Compositional analysis and elemental x-ray mapping of the sample possible using EDAX
  • STEM (Scanning Transmission Electron Microscope) attachment
  • Sample requirement: Sample should be electron transparent and conducting 3mm disk.
 
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